Coda Systems Ltd
- Tel: 01787 478678
- Fax: 01787 274194
- Oak Road, Little Maplestead, Halstead, Essex, CO9 2RT (Road Map)
- Watch Videos View video library.
- Email Enquiry Contact company.
- View Website
View company site.
This company also has:
| Sales Director | Howard Davis |
| Managing Director | Harvey Davis |
| Number of Employees: | 1 - 20 |
General Purpose Test Probes
For general use in many test applications, such as in jigs & fixtures.
ATE Test Probes
For contacting loaded PCBs in automatic test equipment (ATE), jigs and fixtures. Available in 2.54mm, 1.91mm & 1.27mm test centre spacings.
Bench-top Test Jigs
Robust, easily customised, standalone kits for testing a variety of PCB's. Basic hinged-top or cam operated pusher plate, advanced cam-operated gate with fully adjustable pusher-fingers.
Specialist Test Products
o high current test probes
o Kelvin test probes
o high frequency test probes
o switching test probes
o micro test probes
o presence detection switch probes
o pneumatic probing systems
o test jig parts
B2B Products and Services
- ATE - Automatic Test Equipment
- ATE Test Probe LPA2
- ATE Test Probe LPC1
- ATE Test Probe PA4
- ATE Test Probe ST-PA4
- Automotive - Test and Measurement Accessories
- Batteries - Contacts
- Battery Spring Contacts
- Benchtop Test Jig CGF
- Benchtop Test Jig CMF
- Benchtop Test Jig MF
- Bladed Test Probe PD1
- Bladed Test Probe PD2
- Bladed Testing Probes
- Coaxial Spring Probe PE7
- Coaxial Spring Probe PE8
- Coaxial Test Probe PE3
- Coaxial Test Probe PE5
- Codapin battery contact
- Codapin Bench Top Test Jig
- Component Test
- Concentric Test Probe PJ2
- Concentric Test Probe PK2
- Concentric Test Probe PK3
- Concentric Test Probe PK4
- Concentric Test Probe PK5
- Detection Probes
- Docking Station
- Electrical - Contact Probes
- Electronic Components - Testing
- Equipment - Test and Measurement
- Extended Reach Test Probe ELPA2
- Extended Reach Test Probe LPA4
- Extended Reach Test Probe LPA5
- Extended Reach Test Probe LPA7
- Extended Reach Test Probe PJ1
- High Current Test Probe HD-PA10
- High Current Test Probe HD-PA3
- High Current Test Probe HD-PA4
- High Current Test Probe HD-PA5
- High Current Test Probe HD-PA6
- High Current Test Probe HD-PA7
- High Current Test Probe HD-PA8
- High Current Test Probe HD-PA9
- Interface For Docking Station
- Interfacing Components
- Mating contact IPG1
- Mating contact IPG2
- Mating contact IPP2
- Mating contact IPP2-6
- Mating contact IPP3
- Mating contact IPP4
- Mating contact IPP8
- Medium Travel General Test Probe PA3
- Micro Probe PA0
- Micro Probe PA0'R'
- Micro Probe PM1
- Micro Probe PM2
- Micro Probe PM3'R'
- Pass Marking Unit BMP-1
- PCB - Functional Test
- PCB - Test Equipment
- Pneumatic Probing Systems
- Pogo Pins
- Probes
- Probes - ATE
- Probes - Spring
- Probes - Test, High Current
- Probes - Test, Spring Loaded
- RF - Testing
- RF Coaxial Test Probe PE6
- Semiconductors - Test and Measurement
- Short Travel General Test Probe PA1
- Short Travel General Test Probe PA2
- Spring Contact LPC3
- Spring Contact LPC4
- Spring Contact PC0
- Spring Contact PC1
- Spring Contact PC10
- Spring Contact PC11
- Spring Contact PC12
- Spring Contact PC2
- Spring Contact PC3
- Spring Contact PC4
- Spring Contact PC4'T'
- Spring Contact PC5
- Spring Contact PC6
- Spring Contact PC7
- Spring Contact PC8
- Spring Contact PC8'T'
- Spring Contact PC9
- Spring Contact PD10
- Spring Contact PD11
- Spring Contact PD3
- Spring Contact PD4
- Spring Contact PD5
- Spring Contact PD6
- Spring Contact PD7
- Spring Contact PD8
- Spring Contact PD8'T'
- Spring Contact PD9
- Spring Contact PF8
- Spring Contact PG8
- Spring Electrical Contacts
- Spring Loaded Contacts
- Spring Loaded Pins
- Standard Travel Test Probe PA5
- Standard Travel Test Probe PA6
- Standard Travel Test Probe PA7
- Steel ATE Test Probe ST-LPA2
- Steel ATE Test Probe ST-LPC1
- Switch Probe PS3
- Switch Probe PS4
- Switch Probe PS5
- Switch Probe PS6
- Switch Probe PS7
- Switch Probe PS8
- Switch Probe PS9
- Switching Probes
- Test Equipment - Automatic
- Test Equipment - Components
- Test Equipment - High Current
- Test probe
- Test Probes
- Testing - Functional Test
- Transformers - Test Sets
Page 1 of 1 |
First Previous 1 Next Last |
Last Updated: 27-Sep-2012