Coda Systems Ltd

What are Spring Contact Test Probes?

Spring loaded contact test probes have been used for many years to make simultaneous contact to a number of test points on printed circuit boards to test functionality and for measuring component values. They are especially used in test fixtures associated with automatic test equipment (ATE).

Another application is for the functional testing of components, sub-assemblies and finished cable harnesses, where the probes may be used inside the functional test station, as part of a production line.

The spring contact uses a tubular metal tube, ready assembled with the spring and the plunger, as a one-piece item. The spring loaded tip will provide a reliable electrical contact to the target, whose distance away may well be variable. These can be supplied with a variety of plunger tip styles and spring pressures, enabling the most suitable probe to be selected, to make the most reliable contact onto the target.

Most series of probes are mounted into a receptacle, a kind of holder, to which the electrical connection is made. This also allows a probe to be easily removed for cleaning or replacement.

The illustration shows a test probe and its receptacle mounted in a block with the electrical connection made to the tail of the receptacle.

What are Interfacing Components and Contact Lands?

An interfacing component is a spring loaded component designed to make a good quality electrical contact to a mating surface. A typical example of their usage is as a battery contact in a hand held instrument.

Typically, the interfacing component uses a contact land as the mating surface.

The interfacing component is designed to perform the electrical contact many thousands of times.

ATE test probes
General purpose test probes
Interfacing components/battery contacts
Microprobes
High current probes
Kelvin test pins and accessories
Bladed probes
Extended reach probes
Bench top test jigs
Test jig parts
Kelvin probes
Pneumatic probing systems
Detection and switching probes
Pass marking units
Coaxial probes