Dynamic measurement applications used across manufacturing and research and development often require the capability for realtime analysis and realtime results on frequency domains. Often, measurements must be made over multiple domains with several processor settings, and with an archive of data being utilised during testing.
For these reasons here at Data Physics we can provide signals analysis equipment with the capability for simultaneous recording of time and control task or data processing. The throughput data can be recorded at maximum bandwidth on our systems, and event capture and diagnostic triggering features can be used to record an archive of data during testing.
For more information on the Simultaneous Time Data Throughput and Dynamic Measurement systems that we can provide, please feel free to contact us.
