Scanning Electron Microscopy

Scanning electron microscopy (SEM) is carried out with an electron microscope that can produces high resolution images of a sample by scanning it with a targeted beam of electrons. As the electrons interact with atoms in the sample, they produce signals of various types that give detailed data about the topography of its surface and its composition. The prime advantage of SEM over the use of standard light microscopy is that the former can achieve a much higher magnification and resolution, up to 100 times better than a standard microscope. It also allows specimens to be observed in a range of conditions, such as in high vacuum or low vacuum environments; in moist conditions; and at extremes of temperatures. Samples are coated with a thin layer of conducting material, typically carbon or gold, for better imaging. Using a scanning electron microscope has a variety of applications in scientific and industry-related fields, from research in life sciences and medical and forensic science to practical uses in industry and technology such as in electronics, engineering and the automotive industries in production and assembly. These mainly centre on solving product and processing issues.