Swift-Dock ® - Our brand new range of spring loaded, interface arrays for handheld devices and docking stations. Ideal for power and data transfer in devices such as:
Instead of spending a lot of time designing your own bespoke interface, Swift-Dock can be integrated into the design of a handheld device and docking station.
They are available in 2, 4, 5 and 6 pin configurations. Each unit comes as a pair of complete arrays ready fitted with spring loaded contacts on one side and contact lands on the other. The PCB can be supplied with or without a connector.
Spring contacts and lands for PCB interconnection and a wide range of data, power and battery charging applications including:
•charging batteries in portable instruments
•power and data transfer pins in a docking station
•integral compliant contacts, such as for an antenna contact in a mobile phone
•board to board spring contacts for use in computerised gaming systems and telecommunications units
The spring loaded contact consists of a gold plated tubular metal barrel, spring and plunger as a one piece item. The tip of the spring loaded plunger will provide a reliable electrical contact to the target, whose distance away or position may well be uncertain.
To see further information on the specialist products we offer please click Here
Current flows of up to 35 amps for load and functional testing of power components such as semi-conductors, solenoids, loaded PCBs, bus-bars, wound components and batteries. This range shares identical dimensions and will readily intermix with the PA3 - PA7 series and the PC8 series respectively.
A range of concentric test probes intended specifically for making 4 to 6 pole (Kelvin) tests on PCBs, bus bars, equipment chassis and screw heads. tact us regarding our high current/heavy duty range.
Probes with a broad bandwidth for making high frequency tests of RF connectors and PCBs.
Test probes with an integral micro-switch used for electrically testing and signalling the presence of a lead or pin.
For the very fine pitch testing of semi-conductor devices and PCBs down to 0.46mm centres
A range of microprobes designed to allow very fine pitch testing of PCBs, substrates, semiconductors and devices, from 0.46mm to 0.76mm test centres. The PM1, PM2 and PA0 series, are of a non-replaceable design; the space saved by not having a receptacle allows testing to as small as 0.46mm centres. The fitment method is a delicate yet simple process and you can have the option of a pre-attached cable, allowing easier connection to the test jig
A switching probe is conductively connected to the barrel, spring and receptacle while the terminal is insulated from these components and is designed primarily for detecting the absence or presence of non-conductive features, where a normal contact probe can not be used.