Precision Thickness Gauge Ft3-V

Supplied by
  1. AML Instruments Ltd

    Precision Thickness Gauge Ft3-V
    The Hanatek Variable Force Precision Thickness Gauge or Deadweight Micrometer FT3-V is specifically designed to quickly and accurately measure the thickness of a variety of substrates including film, paper, board, foil, tissue and textiles. The Thickness Gauge is operated via an intuitive touch screen interface the instrument will allow the user to define batch size, dwell time & measuring speed. Full test statistics can be easily viewed or printed to label for easy documentation control. Contact pressure varied by adding additional weights to measurement platen. Contact area is factory set. It features a repeatability of better than 0.4 µm and a 0.1 µm resolution with the option of metric or imperial units. It has easy to use touch screen and integrated software. The flatness of measurement head/anvil is <0.1 µm and typical parallelism is <0.1 µm. The temperature stability circuit ensures the instruments electronics reach optimum conditions before testing. The batch testing calculates the thickness difference between two measurement sets, used to assess the thickness of coatings, adhesives or sample batches. The Hanatek Variable Force Precision Thickness gauge comes with an extended two year warranty and a UKAS traceable calibration certificate, 2000 and 500 µm calibrated check gauges.
  2. AML Instruments Ltd

    Precision Thickness Gauge Ft3-V
    The Hanatek Variable Force Precision Thickness Gauge or Deadweight Micrometer FT3-V is specifically designed to quickly and accurately measure the thickness of a variety of substrates including film, paper, board, foil, tissue and textiles. The Thickness Gauge is operated via an intuitive touch screen interface the instrument will allow the user to define batch size, dwell time & measuring speed. Full test statistics can be easily viewed or printed to label for easy documentation control. Contact pressure varied by adding additional weights to measurement platen. Contact area is factory set. It features a repeatability of better than 0.4 µm and a 0.1 µm resolution with the option of metric or imperial units. It has easy to use touch screen and integrated software. The flatness of measurement head/anvil is <0.1 µm and typical parallelism is <0.1 µm. The temperature stability circuit ensures the instruments electronics reach optimum conditions before testing. The batch testing calculates the thickness difference between two measurement sets, used to assess the thickness of coatings, adhesives or sample batches. The Hanatek Variable Force Precision Thickness gauge comes with an extended two year warranty and a UKAS traceable calibration certificate, 2000 and 500 µm calibrated check gauges.